Title page for etd-0811113-154910


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URN etd-0811113-154910
Author Hsiu-Yi Lai
Author's Email Address laijay118519@gmail.com
Statistics This thesis had been viewed 5570 times. Download 2154 times.
Department Physics
Year 2012
Semester 2
Degree Master
Type of Document
Language zh-TW.Big5 Chinese
Title Study of NiO (111) Thin Films Grown by Pulsed Laser Deposition on c-Sapphire: Dependence of Structure and Optical Properties on Oxygen Content
Date of Defense 2013-06-24
Page Count 67
Keyword
  • TEM
  • NiO
  • c-Al2O3
  • thin film
  • Twin
  • Abstract In this thesis work, the NiO thin films with different oxygen contents were grown on c-plane sapphire substrates by pulsed laser deposition (PLD) methods. Transmission electron microscopy (TEM) was employed to study the epitaxial relationship and twin structure between the NiO thin films and the c-Al2O3 substrates. X-ray diffraction (XRD) studies through 2θ-ω, rocking curve, GIXRD and Ф-scans were also conducted to determine the crystallographic orientations, lattice constant changes and general qualities of the NiO samples. The optical properties were investigated by analysis of the transmittance and reflectance data measured in the spectral wavelength range between 400 and1050 nm. The values of some important parameters of the studied films are acquired, such as refractive index (n), extinction coefficient (k), optical absorption coefficient (α) and band-gap energy (Eg). The theme of the thesis was to analyze the NiO structures in correlation to the optical properties of the samples with various oxygen contents acquired by different oxygen partial pressure during the thin film deposition.
    Advisory Committee
  • Den -Jun Jang - chair
  • Zhi-xiong liao - co-chair
  • Li-Wei Tu - co-chair
  • Quark Yung-Sung Chen - advisor
  • Files
  • etd-0811113-154910.pdf
  • Indicate in-campus at 1 year and off-campus access at 1 year.
    Date of Submission 2013-09-11

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