Title page for etd-0802112-022121


[Back to Results | New Search]

URN etd-0802112-022121
Author Hsiang-Chun Wang
Author's Email Address No Public.
Statistics This thesis had been viewed 5560 times. Download 4359 times.
Department Education
Year 2011
Semester 2
Degree Master
Type of Document
Language zh-TW.Big5 Chinese
Title The Development of Academic Self-efficacy Questionnaire
Date of Defense 2012-07-16
Page Count 50
Keyword
  • self-efficacy
  • academic self-efficacy
  • academic achievement
  • rating scale model
  • graded response model
  • Abstract The purpose of this study was to develop a questionnaire to measure academic self-efficacy for undergraduates. The theoretical framework of the questionnaire was based on Bandura’s self-efficacy theory. A total of 409 participants were selected by judgment sampling from the first- and second-grade undergraduate of six colleges in national Sun Yat-sen university (Liberal Arts, Science, Engineering, Management, Marine Sciences, and Social Sciences). The newly developed Academic Efficacy and Motivation Questionnaire (AEMQ) was modified and derived from eight related scales. Expert content validity was conducted by three experts in the field, and the data were analyzed by rating scale model (RSM) in ConQuest. The findings were as follows: 1. All the 69 items in AEMQ have good fit values (MNSQ between 0.6 and 1.4). 2. The items of the AEMQ tended to be too easy for participants. 3. The reliability of each dimension of AEMQ was poor. The highest reliability value was 0.575, and the lowest was 0.382. 4. The first dimension “actual performance” and the second dimension “vicarious experience” have negative correlation with the forth dimension “psychological index”. The result was consistent with past studies.
    Advisory Committee
  • none - chair
  • none - co-chair
  • Ching-Lin Shih - advisor
  • Files
  • etd-0802112-022121.pdf
  • Indicate in-campus at 0 year and off-campus access at 1 year.
    Date of Submission 2012-08-02

    [Back to Results | New Search]


    Browse | Search All Available ETDs

    If you have more questions or technical problems, please contact eThesys