||With electronic devices trending toward higher clock rates, lower voltage levels, and smaller form factors, the simultaneously switching noise (SSN), which is induced in package and printed circuit board, is one of the major factors affecting the performance and design of the high speed digital circuits. This noise will lead to false switching and malfunctioning in digital and/or analog circuits, and causes serious signal integrity (SI) and electromagnetic interference (EMI) problems for the high speed digital systems. Therefore, mitigating the SSN becomes a major challenge for the high speed circuits design.|
In this thesis, first of all, we introduce and discuss previously proposed solutions to suppress the SSN. These solutions include the use of decoupling capacitors, isolation moats, and electromagnetic bnadgap (EBG) structures. We analyzed the EBG structures and generated some EBG design rules. As the speed of digital circuits moving toward higher frequencies, the Open S-bridge EBG structure Using open stub can be used to improve the performance of S-Bridge EBG structure by employing the EBG design rules that were generated. The Open S-bridge EBG structure design improved the behavior at the low frequencies, which also maintained the high frequency performance. It is demonstrated numerically and experimentally. The S-shaped bridge effectively increases the inductance between two adjacent unit cells. And the ripples are held down by open stub to get higher attenuation level. The stop-band of -30 dB suppression bandwidth of the design |S31| is from 114 MHz to 8.5 GHz, The results of simulation and experiment will be presented to verify the good performance, and that it covers the entire noise band.