Title page for etd-0615113-154817


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URN etd-0615113-154817
Author Hsien-Li Chen
Author's Email Address No Public.
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Department Physics
Year 2012
Semester 2
Degree Master
Type of Document
Language zh-TW.Big5 Chinese
Title Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals
Date of Defense 2013-06-26
Page Count 31
Keyword
  • Zinc Oxide
  • reflectance anisotropy spectroscopy
  • TN liquid crystals
  • Abstract Twisted nematic liquid crystals were used to measure reflectance anisotropy spectroscopy of m-plane and c-plane ZnO bulks. This experimental setup was based on Aspnes’s experimental setup in 1988 (D. E. Aspnes, J. P. Harbison, A. A. Studna and L. T. Florez, Appl. Phys. Lett. 52, 957, 1988). Whether the ZnO samples were c-plane or m-plane oriented can be determined by using this measurement. Finally, the direction of c-axis of the m-plane sample can also be determined.
    Advisory Committee
  • I-Min Jiang - chair
  • Tsung-Hsien Lin - co-chair
  • Dong Po Wang - advisor
  • Files
  • etd-0615113-154817.pdf
  • Indicate in-campus at 99 year and off-campus access at 99 year.
    Date of Submission 2013-07-18

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