Title page for etd-0007115-235359


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URN etd-0007115-235359
Author Chih-chang ChangChien
Author's Email Address No Public.
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Department Information Management
Year 2014
Semester 1
Degree Master
Type of Document
Language zh-TW.Big5 Chinese
Title Study on an Architecture-Oriented Semi-conductor Testing Computer Integrated Manufacturing Management Model
Date of Defense 2014-12-20
Page Count 116
Keyword
  • Computer Integrated Manufacturing
  • Management Model
  • Integration
  • Semiconductor Test
  • Architecture-Oriented
  • Abstract Due to the growth of mobile devices in recent years, on one hand we want to reduce wafer volume requirements and the one hand we hope to put a variety of different functions together for chip packaging. This packaging technology is a challenge. The new test procedure affect processes, can also affect the software used in the test plant. Semi-conductor testing is a highly automated environment, the test parameters for the machine table must be very correct, in order to avoid errors. Computer integrated manufacturing (CIM〉 system used in plant needs to be taken care of first. But overall, the new process for the successful mass production is to have the CIM system in collaboration with the relevant departments. CIM system modification play as one of the most influential factors. This study looks forward to the integration of a model through the interactions among the semiconductor test industry and architecture-oriented computer integrated manufacturing management model, thus helps companies enhance their competitiveness.
    Advisory Committee
  • Shuh-Ping Sun - chair
  • William S. Chao - co-chair
  • Wei-Po Lee - advisor
  • Files
  • etd-0007115-235359.pdf
  • Indicate in-campus at 5 year and off-campus access at 99 year.
    Date of Submission 2015-01-08

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