本論文考慮低取樣率的平面近場量測，依據複數近場量測值進行貼片天線之缺陷偵測。毫米波頻段的應用逐漸在5G中佔有重要地位，由於毫米波的天線模組採用天線封裝(Antenna in package,AiP)的技術，使得天線在進行測試的時候，需要使用空中傳輸(Over The Air,OTA)的測試方式，量測天線遠場輻射場型，藉此判斷天線是否有缺陷。由於高頻段有波長短的特性，在遠場量測時，往往需要較遠的距離，因此近年來不少文獻提出以近場量測數值轉換至遠場的方式，來節省量測所需空間。然而，近場至遠場的轉換需要額外的計算複雜度且會造成些許誤差，若可直接由近場量測數值檢測天線模組是否有缺陷，即可避免掉轉換式所帶來的一些問題。因此本論文首先透過近場掃描的複數電場數值，提出三種根據振幅或相位之缺陷偵測演算法，並比較其效能，經過效能模擬得知，複數電場的相位能提供較靈活和較簡易的缺陷偵測設計。然而，近場量測時，若需要掃描所有的取樣點，必定相當的耗時，且不適用於量產產品的檢測，因此，我們根據電場相位的缺陷偵測演算法，進一步研究如何降低取樣點，更明確來說，透過比較良品與各個缺陷之間的相位差比較，尋找與良品有較大相位差的位置，紀錄為近場量測的取樣位置，即可得到節省取樣點的數量。最後，我們根據降低取樣率的取樣位置，再次設計缺陷偵測演算法。根據模擬結果，可看出我們僅需保留25.18%的取樣點，即可擁有與完整取樣點幾乎相同的效能，若運用在實際的測量上，將可大幅節省測量的時間。

This thesis considers planar near-field measurement with low sampling rate, and propose defect detections of patch antenna based on the complex-valued near-field measurements. The applications of the mmWave spectrum plays more and more important roles in 5G. Because the mmWave antenna module adopt the “Antenna-in-Package” technology, it requires to the Over-the-Air (OTA) test to validate the mmWave antenna. The antenna defect can be detected through the radiation pattern of the far-filed measurement, which demands a large measuring distance because of the short wavelength of mmWave signals. With this regard, some researches adopt transformation to the far field pattern from the near field measurement to reduce the measuring space. However, the method requires additional computation burden and leads to some numerical errors. If one may detect the antenna defects directly based on the near field measurements, those drawbacks caused by near-far transformation can be avoided. In this thesis, we proposed three defect detection algorithms based on the amplitudes or phases of the near filed measurements, and then compare the corresponding performance. It shows through numerical simulations that the phases of the near filed measurements provide more flexible and simpler design of defect detection. Nevertheless, it is time-consuming if we scan all the sampling points in the near field measurements, which is not suitable for mass production. Thus, we further investigate the reduction of sampling points for the defect detection based on the phase of the electrical field. Specifically, we look for sampling positions by comparing the phase difference between a perfect antenna module and all the defected antenna modules. The required amount of the sampling points can be greatly reduced by choosing the positions with large phase difference. Through the numerical simulations, it shows that wen simply need to keep 25.18% sampling points with comparable detection performance. We believe the algorithm is helpful to reduce measuring time in practical applications.

目錄
論文審定書 i
致謝 ii
中文摘要 iii
ABSTRACT iv
目錄 vi
圖次 viii
表次 xi
第一章 緒論 1
第二章 背景知識 3
2.1 OTA天線測試 3
2.2 場型區域定義 4
2.3 近場量測方式 6
2.4 近場複數組成 8
第三章 待測天線模型 9
3.1 HFSS之天線設計 9
3.1.1 完美模型 9
3.1.2 缺陷模型 9
3.2 天線模型近場資料 12
3.2.1 完美模型 12
3.2.2 缺陷模型 13
第四章 近場缺陷偵測演算法 23
4.1完整取樣點缺陷偵測演算法 23
4.1.1振幅 23
4.1.2量化相位差 27
4.1.3相位差 34
4.2減少取樣點缺陷偵測演算法 38
第五章 模擬結果 43
5.1 基本設定 43
5.2 完整近場掃描缺陷偵測 45
5.2.1振幅 45
5.2.2量化相位差 46
5.2.3相位差 47
5.2.4效能比較 48
5.3 降低取樣點缺陷偵測 49
第六章 結論 54
參考文獻 55

參考文獻
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